Nanomechanical Characterization of Micellar Surfactant Films via Atomic Force Microscopy at a Graphite Surface-Reference-Cited by-同舟云学术

Nanomechanical Characterization of Micellar Surfactant Films via Atomic Force Microscopy at a Graphite Surface

Published:2017-02-20 Issue:9 Volume:33 Page:2122-2132
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Micklavzina Benjamin L.¹²,Zhang Shengwei¹²,He Hao¹²,Longo Marjorie L.¹²^ORCID

Affiliation:

1. Department of Materials Science and Engineering and ‡Department of Chemical Engineering, University of California, Davis, California 95616, United States

2. Department of Polymer Science and Engineering and ∥Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China

Funder

American Chemical Society Petroleum Research Fund

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.langmuir.6b04315

Reference37 articles.

1. Direct Visualization of Surfactant Hemimicelles by Force Microscopy of the Electrical Double Layer

2. Organization of Sodium Dodecyl Sulfate at the Graphite−Solution Interface

3. Rheology and microstructure studies of SDS/CTAB/H2O system

4. Investigating the Adsorption of the Gemini Surfactant “12−2−12” onto Mica Using Atomic Force Microscopy and Surface Force Apparatus Measurements

5. Soft-contact Atomic Force Microscopy Imaging of Adsorbed Surfactant and Polymer Layers

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