Interpretation of Direct and Indirect Force Modulation Methods Using Polymer Films
Author:
Affiliation:
1. Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd, 3-1-1, Yagumo-Nakamachi, Moriguchi, Osaka 570, Japan, and Department of Electronics Science and Engineering, Kyoto University, Yoshida-Honmachi, Sakyo-ku, Kyoto 619-02, Japan
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la970061j
Reference15 articles.
1. Atomic Force Microscope
2. Using force modulation to image surface elasticities with the atomic force microscope
3. From molecules to cells: imaging soft samples with the atomic force microscope
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