In Situ Investigation of Si-TPA-MFI Crystallization Using (Ultra-) Small- and Wide-Angle X-ray Scattering-Reference-Cited by-同舟云学术

In Situ Investigation of Si-TPA-MFI Crystallization Using (Ultra-) Small- and Wide-Angle X-ray Scattering

Published:1997-12-01 Issue:51 Volume:101 Page:11077-11086
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

de Moor Peter-Paul E. A.¹,Beelen Theo P. M.¹,Komanschek Bernd U.¹,Diat Olivier¹,van Santen Rutger A.¹

Affiliation:

1. Schuit Institute of Catalysis, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands, Daresbury Laboratory, Warrington WA4 4AD, United Kingdom, and European Synchrotron Radiation Facility, Grenoble, BP 220, 38043, France

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp9724784

Reference43 articles.

1. Preface

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