In Situ Scanning Tunneling Microscopy Study of Grain-Dependent Corrosion on Microcrystalline Copper-Reference-Cited by-同舟云学术

In Situ Scanning Tunneling Microscopy Study of Grain-Dependent Corrosion on Microcrystalline Copper

Author:

Martinez-Lombardia Esther¹,Maurice Vincent²,Lapeire Linsey³,De Graeve Iris¹,Verbeken Kim³,Kestens Leo³,Marcus Philippe²,Terryn Herman¹

Affiliation:

1. Research Group Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussels, Belgium

2. PSL Research University, Chimie ParisTech - CNRS, Institut de Recherche de Chimie Paris, 11 rue Pierre et Marie Curie, 75005 Paris, France

3. Department of Materials Science and Engineering, Ghent University (UGent), Technologiepark 903, B-9052 Zwijnaarde (Ghent), Belgium

Funder

Fonds Wetenschappelijk Onderzoek

Agentschap voor Innovatie door Wetenschap en Technologie

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

Reference31 articles.

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