Growth of oriented anodic films on single grains of Zr: structure and epitaxy from anisotropy-micro-ellipsometry
Author:
Publisher
Elsevier BV
Subject
Electrochemistry,General Chemical Engineering
Reference42 articles.
1. Effect of anisotropy on microellipsometry in the system
2. Anisotropy micro-ellipsometry for in-situ determination of optical and crystallographic properties of anisotropic solids and layers with as an example
3. Effect of texture and formation rate on ionic and electronic properties of passive layers on Ti single crystals
4. Electrochemical Characterisation of Oxide Layers on Single Grains of a Polycrystalline Ti-Sample
5. Optical In-situ Methods of High Local Resolution for the Investigation of Corrosion Processes
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