Carbon-13 Labeled Polymers: An Alternative Tracer for Depth Profiling of Polymer Films and Multilayers Using Secondary Ion Mass Spectrometry-Reference-Cited by-同舟云学术

Carbon-13 Labeled Polymers: An Alternative Tracer for Depth Profiling of Polymer Films and Multilayers Using Secondary Ion Mass Spectrometry

Published:2006-04-08 Issue:10 Volume:78 Page:3452-3460
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Harton S. E.¹,Stevie F. A.¹,Zhu Z.¹,Ade H.¹

Affiliation:

1. Department of Materials Science & Engineering, Analytical Instrumentation Facility, and Department of Physics, North Carolina State University, Raleigh, North Carolina 27695

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac060133o

Reference64 articles.

1. Depth profiling methods that provide information complementary to neutron reflectivity

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4. Soft x-ray resonant reflectivity of low-Z material thin films

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