TOF-SIMS/MALDI-TOF combination for the molecular weight depth profiling of polymeric bilayer
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference17 articles.
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3. Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES;Galindo;Anal Bioanal Chem,2010
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