ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single-Beam and Dual-Beam Analysis-Reference-Cited by-同舟云学术

ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single-Beam and Dual-Beam Analysis

Published:2010-01-05 Issue:12 Volume:114 Page:5565-5573
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Brison J.¹,Muramoto S.¹,Castner David G.¹

Affiliation:

1. Departments of Chemical Engineering and Bioengineering, National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Box 351750, Seattle, Washington 98195

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp9066179

Reference42 articles.

1. C60, Buckminsterfullerene: its impact on biological ToF-SIMS analysis

2. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

3. Mass spectral analysis and imaging of tissue by ToF-SIMS—The role of buckminsterfullerene, C60+, primary ions

4. Cluster secondary ion mass spectrometry of polymers and related materials

5. A Theoretical Investigation of the Yield-to-Damage Enhancement with Polyatomic Projectiles in Organic SIMS

Cited by 68 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Secondary ion mass spectrometry;Nature Reviews Methods Primers;2024-05-09

2. Alkali-metal-based molecular-ion secondary ion mass spectrometry for precise quantitative analysis of low-dimensional materials without standards;International Journal of Modern Physics B;2024-02-09

3. ToF-SIMS analysis of ultrathin films and their fragmentation patterns;Journal of Vacuum Science & Technology A;2024-02-05

4. Understanding improved capacity retention at 4.3 V in modified single crystal Ni-rich NMC//graphite pouch cells at elevated temperature;RSC Applied Interfaces;2024

5. High-Resolution Molecular Secondary Ion Mass Spectrometry for Absolute Quantification of Materials in Low-Dimensional Structures: Foundation, Perception and Challenges;Handbook of Materials Science, Volume 1;2023-11-22