High-Sensitivity Photodetectors Based on Multilayer GaTe Flakes
Author:
Affiliation:
1. WPI-Advanced Institute for Materials Research (AIMR), Tohoku University, Sendai 980-8577, Japan
2. Department of Physics, Tohoku University, Sendai 980-8577, Japan
3. Physics Department, Lancaster University, Lancaster LA1 4YB, United Kingdom
Publisher
American Chemical Society (ACS)
Subject
General Physics and Astronomy,General Engineering,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/nn4054039
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