Multiphase Reset Induced Reliable Dual-Mode Resistance Switching of the Ta/HfO<sub>2</sub>/RuO<sub>2</sub> Memristor-Reference-Cited by-同舟云学术

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Multiphase Reset Induced Reliable Dual-Mode Resistance Switching of the Ta/HfO₂/RuO₂ Memristor

Published:2024-03-21 Issue:13 Volume:16 Page:16462-16473
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Shin Dong Hoon¹,Park Hyungjun¹,Ghenzi Néstor¹²^ORCID,Kim Yeong Rok¹,Cheong Sunwoo¹,Shim Sung Keun¹,Yim Seongpil¹,Park Tae Won¹,Song Haewon¹,Lee Jung Kyu¹,Kim Byeong Su¹,Park Taegyun¹,Hwang Cheol Seong¹^ORCID

Affiliation:

1. Department of Materials Science and Engineering and Inter-University Semiconductor Research Center, Seoul National University, Gwanak-ro 1, Gwanak-gu, Seoul 08826, Republic of Korea

2. Universidad de Avelleneda UNDAV and Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET), Mario Bravo 1460, Avellaneda, Buenos Aires 1872, Argentina

Funder

National Research Foundation of Korea

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.3c19523

Reference65 articles.

1. Memory devices and applications for in-memory computing

2. The missing memristor found

3. Resistive switching materials for information processing

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Memristive True Random Number Generator for Security Applications;Sensors;2024-08-02

2. Heterogeneous density-based clustering with a dual-functional memristive array;Materials Horizons;2024

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