Optimizing Hot Electron Harvesting at Planar Metal–Semiconductor Interfaces with Titanium Oxynitride Thin Films-Reference-Cited by-同舟云学术

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Optimizing Hot Electron Harvesting at Planar Metal–Semiconductor Interfaces with Titanium Oxynitride Thin Films

Published:2023-06-12 Issue:25 Volume:15 Page:30417-30426
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Doiron Brock¹,Li Yi¹²^ORCID,Bower Ryan³^ORCID,Mihai Andrei³,Dal Forno Stefano¹,Fearn Sarah³,Hüttenhofer Ludwig²,Cortés Emiliano²,Cohen Lesley F.¹,Alford Neil M.³,Lischner Johannes³⁴^ORCID,Petrov Peter³^ORCID,Maier Stefan A.¹²^ORCID,Oulton Rupert F.¹

Affiliation:

1. Department of Physics, Imperial College London, London SW7 2BW, U.K.

2. Nanoinstitut München, Chair in Hybrid Nanosystems, Faculty of Physics, Ludwig-Maximilians Universität München, Königinstrasse 10, 80539 München, Germany

3. Department of Materials, Imperial College London, London SW7 2AZ, U.K.

4. Thomas Young Centre for Theory and Simulation of Materials, Imperial College London, London SW7 2AZ, U.K.

Funder

Engineering and Physical Sciences Research Council

Deutsche Forschungsgemeinschaft

Centre for Nano and Soft Matter Sciences

Solar Technologies go Hybrid

H2020 European Research Council

Thomas Young Centre

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.3c02812

Reference52 articles.

1. Plasmonics beyond the diffraction limit

2. Biosensing with plasmonic nanosensors

3. Few-Femtosecond Plasmon Dephasing of a Single Metallic Nanostructure from Optical Response Function Reconstruction by Interferometric Frequency Resolved Optical Gating

4. Plasmon-induced hot carrier science and technology

5. TiO2–x-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions

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