Characterizing Ultrathin and Thick Organic Layers by Surface Plasmon Resonance Three-Wavelength and Waveguide Mode Analysis
Author:
Affiliation:
1. Faculty of Pharmacy, Division of Biopharmaceutics and Pharmacokinetics, University of Helsinki, 00014 Helsinki, Finland
2. Oy BioNavis Ltd., 33470 Tampere, Finland
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la401084w
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