High-Pressure and High-Temperature Synthesis and In Situ High-Pressure Synchrotron X-ray Diffraction Study of HfSi2-Reference-Cited by-同舟云学术

High-Pressure and High-Temperature Synthesis and In Situ High-Pressure Synchrotron X-ray Diffraction Study of HfSi2

Published:2021-10-06 Issue:20 Volume:60 Page:15215-15222
ISSN:0020-1669
Container-title:Inorganic Chemistry
language:en
Short-container-title:Inorg. Chem.

Author:

Li Weiwei¹,Wang Pei¹²^ORCID,Xu Chao³,Tang Hu¹^ORCID,Ren Peng¹,Xie Zhiqing¹,Zhou Xuefeng²,Chen Jian²,Wang Shanmin¹²^ORCID,Han Songbai¹,Zhao Yusheng¹²,Wang Liping¹

Affiliation:

1. Academy for Advanced Interdisciplinary Studies and Shenzhen Engineering Research Center for Frontier Materials Synthesis at High Pressures, Southern University of Science and Technology, Shenzhen 518055, P. R. China

2. Department of Physics, Southern University of Science and Technology, Shenzhen 518055, P. R. China

3. College of Science, Wuhan University of Science and Technology, Wuhan 430081, P. R. China

Funder

Southern University of Science and Technology

National Natural Science Foundation of China

Shenzhen Government

Shenzhen Engineering. Research Center for Frontier Materials Synthesis at High Pressures, Southern University

Guangdong Innovative & Entrepreneurial Research Team Program

Publisher

American Chemical Society (ACS)

Subject

Inorganic Chemistry,Physical and Theoretical Chemistry