Dielectrophoretically Controlled Fabrication of Single-Crystal Nickel Silicide Nanowire Interconnects-Reference-Cited by-同舟云学术

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Dielectrophoretically Controlled Fabrication of Single-Crystal Nickel Silicide Nanowire Interconnects

Published:2005-09-27 Issue:10 Volume:5 Page:2112-2115
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Dong Lifeng,Bush Jocelyn,Chirayos Vachara,Solanki Raj,Jiao Jun,Ono Yoshi,Conley John F.,Ulrich Bruce D.

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl051650%2B

Reference19 articles.

1. Alteration of Cu conductivity in the size effect regime

2. Size-dependent resistivity of metallic wires in the mesoscopic range

3. Single-crystal metallic nanowires and metal/semiconductor nanowire heterostructures

4. Electric-field assisted assembly and alignment of metallic nanowires

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