Scanning Line Probe Microscopy: Beyond the Point Probe-Reference-Cited by-同舟云学术

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Scanning Line Probe Microscopy: Beyond the Point Probe

Published:2018-08-28 Issue:19 Volume:90 Page:11531-11537
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

O’Neil Glen D.¹^ORCID,Kuo Han-wen²,Lomax Duncan N.¹,Wright John²,Esposito Daniel V.¹^ORCID

Affiliation:

1. Department of Chemical Engineering, Columbia University in the City of New York, New York, New York 10027, United States

2. Department of Electrical Engineering, Data Science Institute, Columbia University in the City of New York, New York, New York 10027, United States

Funder

Division of Chemistry

Columbia University

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.8b02852

Reference31 articles.

1. Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung

2. Near-Field Optics: Imaging Single Molecules

3. Realization of numerical aperture 2.0 using a gallium phosphide solid immersion lens

4. Atomic Force Microscope

5. New SECM scanning algorithms for improved potentiometric imaging of circularly symmetric targets

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1. Scanning probe microscope;Non-Destructive Material Characterization Methods;2024

2. Simultaneous local sensing of two chemical properties with dual soft probe scanning electrochemical microscopy;Electrochimica Acta;2023-09

3. Flexible Disk Ultramicroelectrode for High-Resolution and Substrate-Tolerable Scanning Electrochemical Microscopy Imaging;Analytical Chemistry;2022-11-30

4. Compressed Sensing Image Reconstruction of Scanning Electrochemical Microscopy Measurements Carried Out at Ultrahigh Scan Speeds Using Continuous Line Probes;Analytical Chemistry;2021-09-08

5. Probing the Speed Limits of Scanning Electrochemical Microscopy with In situ Colorimetric Imaging;ChemElectroChem;2020-06-02

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