Probing the Speed Limits of Scanning Electrochemical Microscopy with In situ Colorimetric Imaging-Reference-Cited by-同舟云学术

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Probing the Speed Limits of Scanning Electrochemical Microscopy with In situ Colorimetric Imaging

Published:2020-06-02 Issue:11 Volume:7 Page:2424-2432
ISSN:2196-0216
Container-title:ChemElectroChem
language:en
Short-container-title:ChemElectroChem

Author:

Dorfi Anna E.¹^ORCID,Zhou Shijie²^ORCID,West Alan C.¹^ORCID,Wright John²^ORCID,Esposito Daniel V.¹^ORCID

Affiliation:

1. Department of Chemical Engineering, Columbia Electrochemical Energy Center, Lenfest Center for Sustainable EnergyColumbia University in the City of New York 500 W 120^th Street New York NY 10027 USA

2. Department of Electrical EngineeringColumbia University in the City of New York 500 W 120^th Street New York NY 10027 USA

Funder

National Science Foundation

Publisher

Wiley

Subject

Electrochemistry,Catalysis

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/celc.202000476

Reference54 articles.

1. Review—Advances in Scanning Electrochemical Microscopy (SECM)

2. Scanning Electrochemical Microscopy: A Comprehensive Review of Experimental Parameters from 1989 to 2015

3. Scanning electrochemical microscopy in the 21st century. Update 1: five years after

4. Scanning electrochemical microscopy in the 21st century

5. High-Speed Electrochemical Imaging

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Compressed Sensing Image Reconstruction of Scanning Electrochemical Microscopy Measurements Carried Out at Ultrahigh Scan Speeds Using Continuous Line Probes;Analytical Chemistry;2021-09-08

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