Enhanced Ion Yields Using High Energy Water Cluster Beams for Secondary Ion Mass Spectrometry Analysis and Imaging-Reference-Cited by-同舟云学术

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Enhanced Ion Yields Using High Energy Water Cluster Beams for Secondary Ion Mass Spectrometry Analysis and Imaging

Published:2019-05-28 Issue:14 Volume:91 Page:9058-9068
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Sheraz Sadia¹,Tian Hua²^ORCID,Vickerman John C.¹³,Blenkinsopp Paul⁴,Winograd Nicholas²,Cumpson Peter¹

Affiliation:

1. School of Mechanical and Systems Engineering, University of Newcastle, Newcastle NE1 7RU, United Kingdom

2. Department of Chemistry, Pennsylvania State University, State College, Pennsylvania 16802, United States

3. Manchester Institute of Biotechnology, University of Manchester, Manchester M1 7DN, United Kingdom

4. Ionoptika Ltd, Chandlers Ford SO53 4BZ, United Kingdom

Funder

National Institute of General Medical Sciences

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.9b01390

Reference48 articles.

1. Advances in Imaging Secondary Ion Mass Spectrometry for Biological Samples

2. Label free biochemical 2D and 3D imaging using secondary ion mass spectrometry

3. Secondary Ion Mass Spectrometry Imaging of Tissues, Cells, and Microbial Systems

4. Molecular mass spectrometry imaging in biomedical and life science research

5. Lipid imaging with time-of-flight secondary ion mass spectrometry (ToF-SIMS)

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