Grazing-Exit Particle-Induced X-ray Emission Analysis with Extremely Low Background-Reference-Cited by-同舟云学术

Grazing-Exit Particle-Induced X-ray Emission Analysis with Extremely Low Background

Published:1999-10-13 Issue:22 Volume:71 Page:5033-5036
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Tsuji Kouichi¹,Spolnik Zoya¹,Wagatsuma Kazuaki¹,Van Grieken René E.¹,Vis Ronald D.¹

Affiliation:

1. Micro- and Trace Analysis Center, Department of Chemistry, University of Antwerp (UIA), B-2610 Antwerpen, Belgium, Institute for Materials Research, Tohoku University, Katahira-2-1-1, Aoba, Sendai, 980-8577 Japan, and Faculty of Physics and Astronomy, Free University, De Boelelaan 1081, 1081 HV Amsterdam, The Netherlands

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac990568u

Reference25 articles.

1. X-ray analysis: Elemental trace analysis at the 10−12 g level

2. Non-linear mapping of microbeam proton-induced X-ray emission data for source identification of North Sea aerosols

3. Performance and characteristics of two total-reflection X-ray fluorescence and a particle induced X-ray emission setup for aerosol analysis

4. The external PIXE setup for the analysis of manuscripts at the Florence University

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A compact and efficient angle-resolved X-ray fluorescence spectrometer for elemental depth profiling;Spectrochimica Acta Part B: Atomic Spectroscopy;2021-07

2. Grazing Emission X‐Ray Fluorescence: Novel Concepts and Applications for Nano‐Analytics;physica status solidi (b);2020-11-03

3. Nanoparticle characterization by means of scanning free grazing emission X-ray fluorescence;Nanoscale;2015

4. Development of a compact grazing exit X-ray fluorescence spectrometer for fast trace elemental analysis;Spectrochimica Acta Part B: Atomic Spectroscopy;2014-11

5. Depth profiling of dopants implanted in Si using the synchrotron radiation based high-resolution grazing emission technique;X-Ray Spectrometry;2012-01-25