Chemical and Elemental Depth Profiling of Very Thin Organic Layers by Constant Kinetic Energy XPS: A New Synchrotron XPS Analysis Strategy
Author:
Affiliation:
1. BAM Bundesanstalt für Materialforschung und -prüfung, 12200 Berlin, Germany
2. Department of Chemical Engineering, McGill University, Montréal, H3A 2B2, Canada
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac300585q
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