Time-of-Flight-Secondary Ion Mass Spectrometry and Principal Component Analysis: Determination of Structures of Lamellar Surfaces-Reference-Cited by-同舟云学术

Time-of-Flight-Secondary Ion Mass Spectrometry and Principal Component Analysis: Determination of Structures of Lamellar Surfaces

Published:2010-03-10 Issue:7 Volume:82 Page:2661-2667
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Lau Yiu-Ting R.¹,Weng Lu-Tao¹,Ng Kai-Mo¹,Chan Chi-Ming¹

Affiliation:

1. Department of Chemical and Biomolecular Engineering, Materials Characterization and Preparation Facility, Advanced Engineering Materials Facility, and Division of Environment, Hong Kong University of Science and Technology, Clear Water Bay, Hong Kong

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac902280h

Reference34 articles.

1. Morphology and properties of semicrystalline polymers

2. Random Re-entry Theory of Polymer Melt Crystallization

3. Infra-red spectrum of the tight (110) fold in n -C 198 H 398

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