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Multiscale Analysis for Field-Effect Penetration through Two-Dimensional Materials

Published:2016-07-15 Issue:8 Volume:16 Page:5044-5052
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Tian Tian¹,Rice Peter²³,Santos Elton J. G.²³,Shih Chih-Jen¹

Affiliation:

1. Institute for Chemical and Bioengineering, ETH Zürich, Zürich 8093, Switzerland

2. School of Mathematics and Physics, Queen’s University Belfast, Belfast BT7 1NN, United Kingdom

3. School of Chemistry and Chemical Engineering, Queen’s University Belfast, Belfast BT7 1NN, United Kingdom

Funder

Eidgenössische Technische Hochschule Zürich

Department for Employment and Learning, Northern Ireland

Queen's University Belfast

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.6b01876

Reference52 articles.

1. Physics of Semiconductor Devices

2. Quantum capacitance devices

3. The Physics of Low-dimensional Semiconductors

4. Two-dimensional electron gas at a semiconductor-semiconductor interface

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