Filamentary High-Resolution Electrical Probes for Nanoengineering-Reference-Cited by-同舟云学术

Filamentary High-Resolution Electrical Probes for Nanoengineering

Published:2020-01-06 Issue:2 Volume:20 Page:1067-1073
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Soh Eugene J. H.¹,Sarwat Syed Ghazi¹,Mazzotta Giulio²^ORCID,Porter Benjamin F.¹,Riede Moritz²^ORCID,Nicholas Robin²,Kim Judy S.¹,Bhaskaran Harish¹^ORCID

Affiliation:

1. Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom

2. Clarendon Laboratory, Department of Physics, University of Oxford, Oxford OX1 3PU, United Kingdom

Funder

Engineering and Physical Sciences Research Council

John Fell Fund, University of Oxford

Agency for Science, Technology and Research

Felix Scholarship

University College, Oxford

Horizon 2020 Framework Programme

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.9b04302

Reference33 articles.

1. Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles

2. Close look at charge carrier injection in polymer field-effect transistors

3. Boron nitride as two dimensional dielectric: Reliability and dielectric breakdown

4. Piezoelectric Nanogenerators Based on Zinc Oxide Nanowire Arrays

5. Electrical measurements of individual semiconducting single-walled carbon nanotubes of various diameters

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