Condensation Induced Blistering as a Measurement Technique for the Adhesion Energy of Nanoscale Polymer Films-Reference-Cited by-同舟云学术

Condensation Induced Blistering as a Measurement Technique for the Adhesion Energy of Nanoscale Polymer Films

Author:

Ma Jingcheng¹^ORCID,Cahill David G.¹²³,Miljkovic Nenad¹²⁴⁵^ORCID

Affiliation:

1. Department of Mechanical Science and Engineering, University of Illinois, Urbana, Illinois 61801, United States

2. Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801, United States

3. Department of Material Science and Engineering, University of Illinois, Urbana, Illinois 61801, United States

4. Department of Electrical and Computer Engineering, University of Illinois, Urbana, Illinois 61801, United States

5. International Institute for Carbon Neutral Energy Research (WPI-I2CNER), Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan

Funder

Ministry of Education, Culture, Sports, Science and Technology

Office of Naval Research

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

Reference46 articles.

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