Imaging Nanometer Phase Coexistence at Defects During the Insulator–Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography

Author:

Vidas Luciana1,Günther Christian M.2,Miller Timothy A.1,Pfau Bastian3,Perez-Salinas Daniel1,Martínez Elías1,Schneider Michael3,Gührs Erik2,Gargiani Pierluigi4,Valvidares Manuel4,Marvel Robert E.5,Hallman Kent A.5,Haglund Richard F.5,Eisebitt Stefan23,Wall Simon1ORCID

Affiliation:

1. ICFO—Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology, Castelldefels, 08860 Barcelona, Spain

2. Institut für Optik und Atomare Physik, Technische Universität Berlin, 10623 Berlin, Germany

3. Max-Born-Institut, 12489 Berlin, Germany

4. ALBA Synchrotron Light Source, Cerdanyola del Vallès, E-08290 Barcelona, Spain

5. Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235-1807, United States

Funder

Fundaci?n Cellex

FP7 People: Marie-Curie Actions

Ministerio de Econom?a y Competitividad

Generalitat de Catalunya

School of Electronic Engineering and Computer Science

Division of Materials Research

Helmholtz-Zentrum Berlin f?r Materialien und Energie

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

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