Revealing Large-Scale Homogeneity and Trace Impurity Sensitivity of GaAs Nanoscale Membranes-Reference-Cited by-同舟云学术

Revealing Large-Scale Homogeneity and Trace Impurity Sensitivity of GaAs Nanoscale Membranes

Published:2017-04-27 Issue:5 Volume:17 Page:2979-2984
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Yang Z.¹,Surrente A.¹,Tutuncuoglu G.²,Galkowski K.¹³,Cazaban-Carrazé M.¹,Amaduzzi F.²,Leroux P.²,Maude D. K.¹,Fontcuberta i Morral A.²,Plochocka P.¹^ORCID

Affiliation:

1. Laboratoire National des Champs Magnétiques Intenses, CNRS-UGA-UPS-INSA, 143 avenue de Rangueil, 31400 Toulouse, France

2. Laboratory of Semiconductor Material, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland

3. Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Pasteura 5, 02-093 Warsaw, Poland

Funder

Agence Nationale de la Recherche

Université de Toulouse

Région Midi-Pyrénées

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.7b00257

Reference53 articles.

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5. Nanoelectronics from the bottom up

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