Depth Profiling Charge Accumulation from a Ferroelectric into a Doped Mott Insulator-Reference-Cited by-同舟云学术

Depth Profiling Charge Accumulation from a Ferroelectric into a Doped Mott Insulator

Published:2015-03-17 Issue:4 Volume:15 Page:2533-2541
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Marinova Maya¹,Rault Julien E.²,Gloter Alexandre¹,Nemsak Slavomir³⁴⁵,Palsson Gunnar K.⁶⁷,Rueff Jean-Pascal²,Fadley Charles S.³⁴,Carrétéro Cécile⁸,Yamada Hiroyuki⁸⁹,March Katia¹,Garcia Vincent⁸,Fusil Stéphane⁸,Barthélémy Agnès⁸,Stéphan Odile¹,Colliex Christian¹,Bibes Manuel⁸

Affiliation:

1. Laboratoire de Physique des Solides, CNRS UMR 8502, Université Paris Sud XI, 91405 Orsay, France

2. Synchrotron-SOLEIL, BP 48, Saint-Aubin, F91192 Gif sur Yvette CEDEX, France

3. Department of Physics, University of California Davis, Davis, California 95616, United States

4. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States

5. Peter Grünberg Institut PGI-6, Forschungszentrum Jülich, 52425 Jülich, Germany

6. Department of Physics and Astronomy, Uppsala University, Box 516, SE-75120 Uppsala, Sweden

7. Institut Laue-Langevin, 38000 Grenoble, France

8. Unité Mixte de Physique CNRS/Thales,1 Avenue A. Fresnel, 91767 Palaiseau, France and Université Paris-Sud, 91405 Orsay, France

9. National Institute of Advanced Industrial Science and Technology (AIST), JST, PRESTO, Tsukuba, Ibaraki 305-8562, Japan

Funder

Agence Nationale de la Recherche

European Research Council

Army Research Office

Seventh Framework Programme

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.5b00104

Reference42 articles.

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4. Origin of the Magnetoelectric Coupling Effect inPb(Zr0.2Ti0.8)O3/La0.8Sr0.2MnO3Multiferroic Heterostructures

5. Controlled-valence properties ofLa1−xSrxFeO3andLa1−xSrxMnO3studied by soft-x-ray absorption spectroscopy

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