Comparison of Three E-Beam Techniques for Electric Field Imaging and Carrier Diffusion Length Measurement on the Same Nanowires-Reference-Cited by-同舟云学术

Comparison of Three E-Beam Techniques for Electric Field Imaging and Carrier Diffusion Length Measurement on the Same Nanowires

Author:

Donatini F.¹²,de Luna Bugallo Andres¹²,Tchoulfian Pierre¹²³,Chicot Gauthier¹²,Sartel Corinne⁴,Sallet Vincent⁴,Pernot Julien¹²⁵

Affiliation:

1. Université Grenoble Alpes, F-38000 Grenoble, France

2. CNRS, Institut NEEL, F-38042 Grenoble, France

3. CEA, LETI, Minatec Campus, F-38054 Grenoble, France

4. Groupe d’Etude de la Matière Condensée (GEMAC), CNRS Université de Versailles St. Quentin, Université Paris-Saclay, 78035 Versailles Cedex, France

5. Institut Universitaire de France, 103 Boulevard Saint-Michel, F-75005 Paris, France

Funder

Agence Nationale de la Recherche

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

Reference25 articles.

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