Origin of giant enhancement of phase contrast in electron holography of modulation-doped <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si43.svg" display="inline" id="d1e166"><mml:mi>n</mml:mi></mml:math>-type GaN-Reference-Cited by-同舟云学术

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Origin of giant enhancement of phase contrast in electron holography of modulation-doped n-type GaN

Published:2024-10 Issue: Volume:264 Page:114006
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Ji K.,Schnedler M.,Lan Q.,Carlin J.-F.,Butté R.,Grandjean N.,Dunin-Borkowski R.E.,Ebert Ph.^ORCID

Publisher

Elsevier BV

Reference42 articles.

1. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction;Müller;Nat. Commun.,2014

2. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy;Müller-Caspary;Ultramicroscopy,2017

3. The influence of illumination conditions in the measurement of built-in electric field at p–n junctions by 4d-stem;da Silva;Appl. Phys. Lett.,2022

4. Quantitative determination of electric field strengths within dynamically operated devices using ebic analysis in the sem;Pugatschow;Scanning Microsc.,2008

5. Comparison of three e-beam techniques for electric field imaging and carrier diffusion length measurement on the same nanowires;Donatini;Nano Lett.,2016

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