Fast Twist Angle Mapping of Bilayer Graphene Using Spectroscopic Ellipsometric Contrast Microscopy-Reference-Cited by-同舟云学术

Fast Twist Angle Mapping of Bilayer Graphene Using Spectroscopic Ellipsometric Contrast Microscopy

Published:2023-06-08 Issue:12 Volume:23 Page:5506-5513
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Potočnik Teja¹,Burton Oliver¹^ORCID,Reutzel Marcel²^ORCID,Schmitt David²,Bange Jan Philipp²,Mathias Stefan²^ORCID,Geisenhof Fabian R.³^ORCID,Weitz R. Thomas²³^ORCID,Xin Linyuan¹,Joyce Hannah J.¹^ORCID,Hofmann Stephan¹^ORCID,Alexander-Webber Jack A.¹^ORCID

Affiliation:

1. Department of Engineering, University of Cambridge, 9 JJ Thompson Avenue, Cambridge CB3 0FA, United Kingdom

2. I. Physikalisches Institut, Georg-August-Universität Göttingen, 37077 Göttingen, Germany

3. Physics of Nanosystems, Department of Physics, Ludwig-Maximilians-Universität München, Geschwister-Scholl-Platz 1, Munich 80539, Germany

Funder

Engineering and Physical Sciences Research Council

Royal Society

Deutsche Forschungsgemeinschaft

Ludwig-Maximilians-Universit?t M?nchen

H2020 European Research Council

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.3c00619

Reference66 articles.

1. Transport Through a Network of Topological Channels in Twisted Bilayer Graphene

2. Selectively enhanced photocurrent generation in twisted bilayer graphene with van Hove singularity

3. Doped Twisted Bilayer Graphene near Magic Angles: Proximity to Wigner Crystallization, Not Mott Insulation

5. Angle-Resolved Raman Imaging of Interlayer Rotations and Interactions in Twisted Bilayer Graphene

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