Detection and Modeling of Hole Capture by Single Point Defects under Variable Electric Fields-Reference-Cited by-同舟云学术

Detection and Modeling of Hole Capture by Single Point Defects under Variable Electric Fields

Published:2023-05-04 Issue:10 Volume:23 Page:4495-4501
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Lozovoi Artur¹^ORCID,Chen YunHeng²,Vizkelethy Gyorgy³,Bielejec Edward³,Flick Johannes¹⁴⁵^ORCID,Doherty Marcus W.²^ORCID,Meriles Carlos A.¹⁵^ORCID

Affiliation:

1. Department. of Physics, CUNY-City College of New York, New York, New York 10031, United States

2. Department of Quantum Science and Technology, Research School of Physics, Australian National University, Canberra, Australian Capital Territory 2601, Australia

3. Sandia National Laboratories, Albuquerque, New Mexico 87185, United States

4. Center for Computational Quantum Physics, Flatiron Institute, New York, New York 10010, United States

5. CUNY-Graduate Center, New York, New York 10016, United States

Funder

Australian Research Council

National Science Foundation

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.3c00860

Reference52 articles.

1. First-principles calculations for point defects in solids

2. Theory of Defects in Semiconductors

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4. Quantum sensing

5. Quantum technologies with optically interfaced solid-state spins

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