AFM-Topological Data Analysis of Brass after Ultrasonic Surface Modification-Reference-Cited by-同舟云学术

AFM-Topological Data Analysis of Brass after Ultrasonic Surface Modification

Published:2023-08-14 Issue:8 Volume:1 Page:2084-2091
ISSN:2771-9545
Container-title:ACS Applied Engineering Materials
language:en
Short-container-title:ACS Appl. Eng. Mater.

Author:

Zhukov Mikhail V.¹,Aglikov Aleksandr S.¹,Sabboukh Mirnah¹,Kozodaev Dmitry A.²,Aliev Timur A.¹^ORCID,Ulasevich Sviatlana A.¹,Nosonovsky Michael¹³^ORCID,Skorb Ekaterina V.¹^ORCID

Affiliation:

1. Infochemistry Scientific Centre, ITMO University, 9 Lomonosova Street, 191002 Saint Petersburg, Russia

2. NT-MDT BV, Hoenderparkweg 96B, 7335 Apeldoorn, The Netherlands

3. Mechanical Engineering Department, University of Wisconsin-Milwaukee, 3200 N Cramer Street, Milwaukee, Wisconsin 53211, United States

Funder

Ministry of Science and Higher Education of the Russian Federation

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaenm.3c00233

Reference25 articles.

1. Structural changes of metallic surfaces induced by ultrasound

2. A Chemical Route to Carbon Nanoscrolls

3. Ultrasound-responsive Homopolymer Nanoparticles

4. Sonochemical Synthesis of Trigonal Selenium Nanowires

5. Sonochemical Synthesis of Highly Fluorescent Ag Nanoclusters

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. New metrics for describing atomic force microscopy data of nanostructured surfaces through topological data analysis;Applied Surface Science;2024-10

2. Benchmarking Unsupervised Clustering Algorithms for Atomic Force Microscopy Data on Polyhydroxyalkanoate Films;ACS Omega;2024-04-29

3. Topological Data Analysis of Nanoscale Roughness of Layer-by-Layer Polyelectrolyte Samples Using Machine Learning;ACS Applied Electronic Materials;2023-11-17