New metrics for describing atomic force microscopy data of nanostructured surfaces through topological data analysis-Reference-Cited by-同舟云学术

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New metrics for describing atomic force microscopy data of nanostructured surfaces through topological data analysis

Published:2024-10 Issue: Volume:670 Page:160640
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Aglikov Aleksandr S.^ORCID,Zhukov Mikhail V.,Aliev Timur A.,Kozodaev Dmitry A.,Nosonovsky Michael,Skorb Ekaterina V.^ORCID

Funder

Ministry of Education and Science of the Russian Federation

Publisher

Elsevier BV

Reference36 articles.

1. Noninnocent Nature of Carbon Support in Metal/Carbon Catalysts: Etching/Pitting vs Nanotube Growth under Microwave Irradiation

2. Radionuclide-labeled nanostructures for In Vivo imaging of cancer

3. Immunochemical biosensor for single virus particle detection based on molecular crowding polyelectrolyte system

4. K. G. Nikolaev;Baldina;Polymers,2022

5. Three-Dimensional Printing of Poly(3-hydroxybutyrate-co-3-hydroxyvalerate) [P(3HB-co-3HV)] Biodegradable Scaffolds: Properties, In Vitro and In Vivo Evaluation

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