Femtosecond Trapping of Free Electrons in Ultrathin Films of NaCl on Ag(100)-Reference-Cited by-同舟云学术

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Femtosecond Trapping of Free Electrons in Ultrathin Films of NaCl on Ag(100)

Published:2014-08-25 Issue:17 Volume:5 Page:3073-3077
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Suich David E.¹²,Caplins Benjamin W.¹²,Shearer Alex J.¹²,Harris Charles B.¹²

Affiliation:

1. Department of Chemistry, University of California at Berkeley, 419 Latimer Hall, Berkeley, California 94720, United States

2. Chemical Sciences Division, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, California 94720, United States

Funder

Basic Energy Sciences

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jz501572z

Reference32 articles.

1. Single Molecular Wires Connecting Metallic and Insulating Surface Areas

2. Solar Water Splitting Cells

3. Effect of LiF/metal electrodes on the performance of plastic solar cells

4. Controlling the Charge State of Individual Gold Adatoms

5. High-Resolution Molecular Orbital Imaging Using ap-Wave STM Tip

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1. Effect of a Dielectric Spacer on Electronic and Electromagnetic Interactions at Play in Molecular Exciton Decay at Surfaces and in Plasmonic Gaps;ACS Photonics;2021-11-17

2. Complexity at simple interfaces: Dynamically generated deep trap states at the noble-metal/alkali-halide interface;Physical Review B;2018-02-28

3. Atomistic and Electronic Structure Methods for Nanostructured Oxide Interfaces;Oxide Materials at the Two-Dimensional Limit;2016

4. Correction to “Femtosecond Trapping of Free Electrons in Ultrathin Films of NaCl on Ag(100)”;The Journal of Physical Chemistry Letters;2015-10-15

5. Real-Space Imaging of Carrier Dynamics of Materials Surfaces by Second-Generation Four-Dimensional Scanning Ultrafast Electron Microscopy;The Journal of Physical Chemistry Letters;2015-09-16

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