Real-Space Imaging of Carrier Dynamics of Materials Surfaces by Second-Generation Four-Dimensional Scanning Ultrafast Electron Microscopy-Reference-Cited by-同舟云学术

Real-Space Imaging of Carrier Dynamics of Materials Surfaces by Second-Generation Four-Dimensional Scanning Ultrafast Electron Microscopy

Published:2015-09-16 Issue:19 Volume:6 Page:3884-3890
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Sun Jingya¹,Melnikov Vasily A.¹,Khan Jafar I.¹,Mohammed Omar F.¹

Affiliation:

1. Solar and Photovoltaics Engineering Research Center, Division of Physical Sciences and Engineering, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Kingdom of Saudi Arabia

Funder

King Abdullah University of Science and Technology

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.5b01867

Reference45 articles.

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3. Boosting the Efficiency of Quantum Dot Sensitized Solar Cells through Modulation of Interfacial Charge Transfer

4. Quantum Confinement-Tunable Ultrafast Charge Transfer at the PbS Quantum Dot and Phenyl-C61-butyric Acid Methyl Ester Interface

5. Rate Constants for Charge Transfer Across Semiconductor-Liquid Interfaces

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