Mapping Carrier Dynamics on Material Surfaces in Space and Time using Scanning Ultrafast Electron Microscopy-Reference-Cited by-同舟云学术

Mapping Carrier Dynamics on Material Surfaces in Space and Time using Scanning Ultrafast Electron Microscopy

Published:2016-03-03 Issue:6 Volume:7 Page:985-994
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Sun Jingya¹,Adhikari Aniruddha¹,Shaheen Basamat S.¹,Yang Haoze¹,Mohammed Omar F.¹

Affiliation:

1. Solar and Photovoltaics Engineering Research Center, Division of Physical Sciences and Engineering, King Abdullah University of Science and Technology, Thuwal 23955-6900, Kingdom of Saudi Arabia

Funder

King Abdullah University of Science and Technology

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.5b02908

Reference63 articles.

1. Four-dimensional ultrafast electron microscopy

2. 4D ULTRAFAST ELECTRON DIFFRACTION, CRYSTALLOGRAPHY, AND MICROSCOPY

3. Four-Dimensional Electron Microscopy

4. 4D Electron Microscopy: Principles and Applications

5. Photonics and Plasmonics in 4D Ultrafast Electron Microscopy

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