Electronic Correlations in FexNiyPS3 Van der Waals Materials: Insights from Angle-Resolved Photoelectron Spectroscopy and DFT-Reference-Cited by-同舟云学术

Electronic Correlations in Fe_xNi_yPS₃ Van der Waals Materials: Insights from Angle-Resolved Photoelectron Spectroscopy and DFT

Published:2023-10-26 Issue:43 Volume:14 Page:9774-9779
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Yan Mouhui¹²,Jin Yichen¹³^ORCID,Voloshina Elena¹⁴^ORCID,Dedkov Yuriy¹^ORCID

Affiliation:

1. Department of Physics, Shanghai University, 99 Shangda Road, 200444 Shanghai, P. R. China

2. State Key Laboratory of Advanced Special Steel & School of Materials Science and Engineering, Shanghai University, 99 Shangda Road, 200444 Shanghai, P. R. China

3. Department of Physics, Humboldt-Universität zu Berlin, 12489 Berlin, Germany

4. Institut für Chemie und Biochemie, Freie Universität Berlin, Arnimallee 22, 14195 Berlin, Germany

Funder

National Natural Science Foundation of China

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.3c02688

Reference37 articles.

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4. Weak Van der Waals Stacking, Wide-Range Band Gap, and Raman Study on Ultrathin Layers of Metal Phosphorus Trichalcogenides

5. Progress in the studies of electronic and magnetic properties of layered MPX₃ materials (M: transition metal, X: chalcogen)

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