Weak Van der Waals Stacking, Wide-Range Band Gap, and Raman Study on Ultrathin Layers of Metal Phosphorus Trichalcogenides-Reference-Cited by-同舟云学术

Weak Van der Waals Stacking, Wide-Range Band Gap, and Raman Study on Ultrathin Layers of Metal Phosphorus Trichalcogenides

Published:2015-12-04 Issue:2 Volume:10 Page:1738-1743
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Du Ke-zhao¹²,Wang Xing-zhi²,Liu Yang²,Hu Peng¹,Utama M. Iqbal Bakti²,Gan Chee Kwan³,Xiong Qihua²⁴,Kloc Christian¹

Affiliation:

1. School of Materials Science & Engineering, Nanyang Technological University, Singapore 639798, Singapore

2. Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore 637371, Singapore

3. Institute of High Performance Computing, Agency for Science, Technology and Research, 1 Fusionopolis Way, #16-16 Connexis, Singapore 138632, Singapore

4. NOVITAS, Nanoelectronics Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore

Funder

Ministry of Education - Singapore

Air Force Office of Scientific Research

National Research Foundation-Prime Minister's office, Republic of Singapore

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.5b05927

Reference48 articles.

1. Electric Field Effect in Atomically Thin Carbon Films