Improving Secondary Ion Mass Spectrometry C60n+Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing-Reference-Cited by-同舟云学术

Improving Secondary Ion Mass Spectrometry C60n+Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing

Published:2013-05-08 Issue:10 Volume:85 Page:5064-5070
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Havelund R.¹,Licciardello A.²,Bailey J.³,Tuccitto N.²,Sapuppo D.²,Gilmore I. S.¹,Sharp J. S.³,Lee J. L. S.¹,Mouhib T.⁴,Delcorte A.⁴

Affiliation:

1. National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom

2. Laboratory for Molecular Surfaces and Nanotechnology (LAMSUN), Dipartimento di Scienze Chimiche, Università degli Studi di Catania and CSGI, Via A. Doria 6, 95125 Catania, Italy

3. School of Physics and Astronomy and Nottingham Nanotechnology and Nanoscience Centre, University of Nottingham, University Park, Nottingham, NG7 2RD, United Kingdom

4. Institute of Condensed Matter and Nanosciences-Bio & Soft Matter, Université Catholique de Louvain, Croix du Sud, 1 bte L7.04.01; B-1348 Louvain-la-Neuve, Belgium

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac4003535

Reference26 articles.

1. Relating the Morphology of Poly(p-phenylene vinylene)/Methanofullerene Blends to Solar-Cell Performance

2. Thin film polymer photonics: Spin cast distributed Bragg reflectors and chirped polymer structures

3. Infrared dielectric mirrors based on thin film multilayers of polystyrene and polyvinylpyrrolidone

4. Analysis of Ink/Coating Penetration on Paper Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) in Conjunction with Principal Component Analysis (PCA)

5. TOF-SIMS Characterization and Imaging of Controlled-Release Drug Delivery Systems

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