Analysis of Ink/Coating Penetration on Paper Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) in Conjunction with Principal Component Analysis (PCA)
Author:
Publisher
Informa UK Limited
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,General Chemistry
Link
http://www.tandfonline.com/doi/pdf/10.1080/00218460801954474
Reference26 articles.
1. Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
2. Time-of-flight secondary ion mass spectrometry (TOF-SIMS):—versatility in chemical and imaging surface analysis
3. The observation and distribution of organic additives on paper surfaces using surface spectroscopic techniques
4. SIMS imaging of paper surfaces. Part 4. The detection of desizing agents on hard-to-size paper surfaces
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