Crystallization of NiSix in a Body-Centered Cubic Structure during Solid-State Reaction between an Ultrathin Ni Film and Si(001) Substrate at 150–350 °C
Author:
Affiliation:
1. Thin Film Physics Division, IFM, Linköping University, 58183 Linköping, Sweden
2. Solid-State Electronics, The Ångström Laboratory, Uppsala University, 751 21 Uppsala, Sweden
Publisher
American Chemical Society (ACS)
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/cg301627y
Reference28 articles.
1. Nucleation of a new phase from the interaction of two adjacent phases: Some silicides
2. Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiSi2Epitaxial Structures
3. Surface-energy triggered phase formation and epitaxy in nanometer-thick Ni1−xPtx silicide films
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