High-Fidelity 3D-Nanoprinting via Focused Electron Beams: Computer-Aided Design (3BID)-Reference-Cited by-同舟云学术

High-Fidelity 3D-Nanoprinting via Focused Electron Beams: Computer-Aided Design (3BID)

Published:2018-02-14 Issue:3 Volume:1 Page:1028-1041
ISSN:2574-0970
Container-title:ACS Applied Nano Materials
language:en
Short-container-title:ACS Appl. Nano Mater.

Author:

Fowlkes Jason D.¹^ORCID,Winkler R.²,Lewis Brett B.,Fernández-Pacheco A.³^ORCID,Skoric L.³,Sanz-Hernández D.³^ORCID,Stanford Michael G.^ORCID,Mutunga Eva,Rack P. D.¹,Plank H.²⁴^ORCID

Affiliation:

1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

2. Graz Centre for Electron Microscopy, Steyrergasse 17, 8010 Graz, Austria

3. Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, U.K.

4. Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Steyrergasse 17, 8010 Graz, Austria

Funder

Engineering and Physical Sciences Research Council

?sterreichische Forschungsf?rderungsgesellschaft

European Cooperation in Science and Technology

Winton Fund for the Physics of Sustainability

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

http://pubs.acs.org/doi/pdf/10.1021/acsanm.7b00342

Reference56 articles.

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5. Additive Manufacturing of Metal Structures at the Micrometer Scale

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