Metal-Assisted Secondary Ion Mass Spectrometry: Influence of Ag and Au Deposition on Molecular Ion Yields-Reference-Cited by-同舟云学术

Metal-Assisted Secondary Ion Mass Spectrometry: Influence of Ag and Au Deposition on Molecular Ion Yields

Published:2004-10-15 Issue:22 Volume:76 Page:6777-6785
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Adriaensen L.¹,Vangaever F.¹,Gijbels R.¹

Affiliation:

1. Department of Chemistry (MiTAC), University of Antwerp, Universiteitsplein 1 B-2610 Wilrijk, Belgium, and Agfa-Gevaert N.V., B-2640 Mortsel, Belgium

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac049108d

Reference26 articles.

1. Hagenhoff, B. SIMS Analysis of Organic Materials.Secondary Ion MassSpectrometry SIMS IX; Benninghoven, A., et al., Eds.; John Wiley: Chichester, 1993, pp 753−756.

2. Doped gelatin films as a model matrix for molecular secondary ion mass spectrometry studies of biological soft tissue

3. Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation

4. Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-Assembled Monolayers on Silver and Gold

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