Complex Dielectric Characteristics, ac-Conductivity, and Impedance Spectroscopy of B-Doped nc-SiOX:H Thin Films
Author:
Affiliation:
1. Energy Research Unit, School of Materials Sciences, Indian Association for the Cultivation of Science, Jadavpur, Kolkata 700 032, India
Funder
Council of Scientific and Industrial Research
Department of Science and Technology, Ministry of Science and Technology
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials
Link
https://pubs.acs.org/doi/pdf/10.1021/acsaelm.0c01110
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1. Quantum confinement effects in nano-silicon thin films
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4. Hydrogen evolution in hydrogenated microcrystalline silicon carbide thin films
5. Low-temperature synthesis of conducting boron-doped nanocrystalline silicon oxide thin films as the window layer of solar cells
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