Influence of Interface on the Charge Carrier Mobility of La2Ti2O7 Layered Perovskite Thin Films Measured by the Time-of-Flight Method-Reference-Cited by-同舟云学术

Influence of Interface on the Charge Carrier Mobility of La2Ti2O7 Layered Perovskite Thin Films Measured by the Time-of-Flight Method

Published:2021-07-16 Issue:7 Volume:3 Page:3167-3176
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Leroy Sébastien¹,Douali Redouane²,Legrand Christian²,Krasinski Freddy²,Blanchard Florent³^ORCID,Roussel Pascal³^ORCID,Saitzek Sébastien¹^ORCID,Blach Jean-François¹^ORCID

Affiliation:

1. Univ. Artois, CNRS, Centrale Lille, Univ. Lille, UMR 8181 – UCCS – Unité de Catalyse et Chimie du Solide, F-62300 Lens, France

2. ULCO, Unité de Dynamique et Structure des Matériaux Moléculaires (UDSMM) EA 4476, F-62100 Calais, France

3. Univ. Lille, CNRS, Centrale Lille, Univ. Artois, UMR 8181 – UCCS – Unité de Catalyse et Chimie du Solide, F-59000 Lille, France

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.1c00365

Reference38 articles.

1. Effective piezoelectric coefficient measurement of BaTiO3 thin films using the X-ray diffraction technique under electric field available in a standard laboratory

2. Photovoltaic effects in BiFeO3

3. Formation of Nanometric HT-LiCoO2 by a Precipitation and Aging Process in an Alcoholic Solution

4. Synthesis, structural and luminescence properties of (La1−xLnx)2Ti2O7 (Ln=lanthanides) solid solutions

5. Electronic structure of layered ferroelectric high-ktitanate La2Ti2O7

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