Effective piezoelectric coefficient measurement of BaTiO3 thin films using the X-ray diffraction technique under electric field available in a standard laboratory-Reference-Cited by-同舟云学术

Effective piezoelectric coefficient measurement of BaTiO3 thin films using the X-ray diffraction technique under electric field available in a standard laboratory

Published:2015-10 Issue: Volume:351 Page:480-486
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Thery Virginie,Bayart Alexandre,Blach Jean-François,Roussel Pascal,Saitzek Sébastien^ORCID

Funder

Fonds Européen de Développement Régional (FEDER)

CNRS

Région Nord Pas-de-Calais

Ministère de l’Education Nationale de l’Enseignement Supérieur et de la Recherche

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

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