Probing Molecular Packing at Engineered Interfaces in Organic Field Effect Transistor and Its Correlation with Charge Carrier Mobility-Reference-Cited by-同舟云学术

Probing Molecular Packing at Engineered Interfaces in Organic Field Effect Transistor and Its Correlation with Charge Carrier Mobility

Published:2015-05-11 Issue:19 Volume:7 Page:10169-10177
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Maheshwari Priya,Mukherjee Saurabh,Bhattacharya Debarati,Sen Shashwati,Tokas Raj Bahadur,Honda Yoshihide¹,Basu Saibal,Padma Narayanan,Pujari Pradeep Kumar

Affiliation:

1. The Institute of Scientific Research, Osaka University, Osaka, Ibaraki, Japan

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.5b00311

Reference41 articles.

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4. Comparative studies on the stability of polymer versus SiO2 gate dielectrics for pentacene thin-film transistors

5. Hysteresis behaviour of low-voltage organic field-effect transistors employing high dielectric constant polymer gate dielectrics

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