TOF-SIMS Analysis Using C60. Effect of Impact Energy on Yield and Damage
Author:
Affiliation:
1. Surface Analysis Research Centre, School of Chemical Engineering and Analytical Science, The University of Manchester, Manchester M60 1QD, UK
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac051624w
Reference18 articles.
1. Kiloelectronvolt Argon-Induced Molecular Desorption from a Bulk Polystyrene Solid
2. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics
3. A Theoretical Investigation of the Yield-to-Damage Enhancement with Polyatomic Projectiles in Organic SIMS
Cited by 83 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Revealing the Role of Thiocyanate for Improving the Performance of Perovskite Solar Cells;ACS Applied Energy Materials;2022-12-19
2. Secondary ion mass spectrometry using energetic cluster ion beams: Toward highly sensitive imaging mass spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09
3. Validated Analysis of Component Distribution Inside Perovskite Solar Cells and Its Utility in Unveiling Factors of Device Performance and Degradation;ACS Applied Materials & Interfaces;2020-05-01
4. Secondary Ion Yield and Fragmentation of Biological Molecules by Employing 35Cl Primary Ions within the MeV Energy Domain;Journal of the American Society for Mass Spectrometry;2019-11-20
5. MeV-SIMS TOF Imaging of Organic Tissue with Continuous Primary Beam;Journal of the American Society for Mass Spectrometry;2019-06-27
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3