Room-Temperature Single-Electron Charging Detected by Electrostatic Force Microscopy
Author:
Affiliation:
1. Physics Department, McGill University, 3600 University Street, Montreal, QC H3A 2T8, Canada
Publisher
American Chemical Society (ACS)
Subject
General Physics and Astronomy,General Engineering,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/nn401840n
Reference33 articles.
1. Single-electron devices and their applications
2. CMOS-compatible fabrication of room-temperature single-electron devices
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4. Frequency shift imaging of quantum dots with single-electron resolution
5. Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy
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