Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy-Reference-Cited by-同舟云学术

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Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy

Published:2005-02-08 Issue:5 Volume:94 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Stomp Romain,Miyahara Yoichi,Schaer Sacha,Sun Qingfeng,Guo Hong,Grutter Peter,Studenikin Sergei,Poole Philip,Sachrajda Andy

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.94.056802/fulltext

Reference19 articles.

1. Spectroscopy of Quantum Levels in Charge-Tunable InGaAs Quantum Dots

2. Few-electron ground states of charge-tunable self-assembled quantum dots

3. Identification of atomic-like electronic states in indium arsenide nanocrystal quantum dots

4. Wave-Function Mapping of InAs Quantum Dots by Scanning Tunneling Spectroscopy

5. Observation of single charge carriers by force microscopy

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