Conductance, Surface Traps, and Passivation in Doped Silicon Nanowires
Author:
Affiliation:
1. Laboratoire de Physique de la Matiere Condensee et Nanostructures, Universite Lyon 1, UMR CNRS 5586, Domaine universitaire de la Doua, F-69622 Villeurbanne, France
Publisher
American Chemical Society (ACS)
Subject
Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering
Link
https://pubs.acs.org/doi/pdf/10.1021/nl0614258
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